Column Control DTX

4080 Series Parametric Testers

Brochures

×

Change email?

Please have a sales representative contact me.

Thank you.

Your form has been successfully submitted.

The current web page context is a document that describes the 4080 Series Parametric Testers from Keysight Technologies, a leading provider of semiconductor test solutions. The document highlights the features and benefits of the 4080 Series models, such as 4082A Parametric Test System and 4082F Flash Memory Cell Parametric Test System, which offer high performance, throughput, and measurement capabilities for various parametric test requirements. The document also explains the hardware, software, accessories, and professional services that are available for the 4080 Series, as well as the upgrade options and renewal plans for existing customers. The document provides several www.keysight.com URLs for more information and contact details for ordering and sales inquiries. The document is intended for potential and current customers who are looking for a total solution for parametric test in semiconductor wafer production.
Column Control DTX