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Using PathWave Manufacturing Analytics to Achieve Greater Production First Pass Yield

Application Notes

Achieving greater production first pass yield (FPY) means a positive production throughput — which leads to higher top-line revenue. A critical cause of first pass yield loss is false failures that occur during unstable tests. Improving production FPY includes developing and maintaining more stable tests to result in less false failures. Do you want to learn how to use this data to improve your production FPY?

Keysight PathWave Manufacturing Analytics is a web-based big data analytics application to help improve manufacturing efficiencies. It is an Industry 4.0-ready electronics manufacturing data analytics solution which performs advanced analytics using process, test, and equipment data to drive manufacturing improvements and efficiencies. Its predictive and anomaly detection algorithms perform an extensive range of real-time data analytics that anticipates anomalies in your equipment, process, or product to mitigate risk.

Working with Internet of Things (IOT) sensors, PathWave Manufacturing Analytics collects and analyzes environmental data, machine productivity data, and measurement data to predict equipment and fixture failure in real time. This eliminates the need for periodic maintenance and extends mean time between failure — leading to greater asset utilization.

This application note describes the essential functions to check the condition of your manufacturing equipment to maintain or improve efficiencies.

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