Implementing Cover-Extend Test on Boundary Scan Analyzers
Application Notes
Cover-Extend Technology (CET) is one of the limited test access solutions Keysight Technologies provides. It is a hybrid technology between VTEP and boundary scan. Unlike the VTEP technology which relies on a nailed resource to provide the stimulus that VTEP test needs, the stimulus for CET test comes from a Boundary Scan IC. This IC must be compliant with the IEEE1149 standard and can be controlled with only four pins (TMS, TCK, TDI and TDO). This greatly reduces the need for physical test access.