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Electrical Structural Tester Non-Destructive Electrical Structural Testing for Wire Bonds
Model: Q3800AAccurately detect subtle wire bond defects
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Electrical Structural Tester
Discover a nondestructive capacitive-based testing solution that accurately identifies defects in wire-bonded microelectronics.
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Test types
Single Die Wire-Bonded Packages
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System width
700 mm to 1,430 mm
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Maximum parallel testing
4 to 20 sites
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Find out what's included and explore available upgrade options from Keysight.
Highlights
Innovative solutions for identifying wire bond defects
The Keysight electrical structural tester is a capacitive-based testing solution designed to identify wire bond defects accurately. Leveraging the advanced part average test (PAT) analysis, the tester establishes a baseline from known-good units to swiftly detect deviations like near-shorts, stray wires, wire sweeps, and sags within integrated circuits (ICs). This capability ensures robust product quality management and significantly enhances manufacturing efficiency. The electrical structural tester enables you to:
- Test single-die wire bonded packages in singulated or strip-based form factor.
- Achieve high-volume production with up to 20 parallel test sites, achieving up to 72,000 IC units per hour (UPH).
- Enhance yield through advanced methods like marginal retry test (MaRT), dynamic part averaging test (DPAT) and real-time part averaging test (RPAT).
Services and support
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
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