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K8215B Advanced Throughput Multiplier Feature, GTE 10.00p
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
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利用進階量測速率倍增（Advanced Throughput Multiplier）功能，您可在一台 4 模組測試儀上，同時測試最多 2 個 1,000 至 2,000 節點（介於 1,296 和 2,592 節點之間）的電路板，將測試時間縮短一半。
HIGHLIGHTS
The i3070 In-Circuit Test System architecture is split into 4 modules. Each module can execute tests in parallel with the rest, so you can test 4 printed circuit boards at one time.
For cases when you need to test homogeneous (identical) boards with more than 1000 nodes each, you can combine 2 modules together using the Advanced Throughput Multiplier feature. This allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
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