Application Notes

Tips: Improve Environment Noise for LF Noise

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The E4727B Advanced Low-Frequency Noise Analyzer enables fast, accurate and repeatable low-frequency noise (LFN) measurements on numerous device types. Now, thanks to tight integration with Keysight’s WaferPro Express software, device modeling and characterization engineers can now add noise measurements to a larger suite that includes high-speed DC, capacitance and RF S-parameter measurements, all the while automating wafer prober control.

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Tips: Improve Environment Noise for LF Noise