Choose a country or area to see content specific to your location
-
PRODUCTS AND SERVICES
-
Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzer
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
-
Meters
-
Generators, Sources, and Power Supplies
-
Software
-
Wireless
-
Modular Instruments
-
Network Test and Security
-
Network Visibility
-
Services
- KeysightCare Service und Support
- KeysightAccess Service
- Calibration Services | Global Calibration Services
- Repair Services
- Technology Refresh Services
- Test as a Service — TaaS
- Network / Security Services
- Consulting Services
- Financial Services
- Schulungen und Weiterbildung
- Keysight Support Portal
- Used Equipment
- All Services
-
Additional Products
- All Products, Software, Services
-
-
Solutions
-
Explore by Use Case
Explore by Industry
- All Solutions
- Learn
- Buy
- Support
Können wir Ihnen behilflich sein?
- Keysight.Home
- PRODUKTE UND DIENSTLEISTUNGEN
- Accessories
- Probes and Probe Accessories
- N2875A Passive Probe, 20:1, 500 MHz, 1.3 m
N2875A Passive Probe, 20:1, 500 MHz, 1.3 m
Easily probe densely populated IC components
Verkauf durch: Keysight Online Sales
HIGHLIGHTS
- 500 MHz bandwidth
- 20:1 attenuation ratio
- 5.6 pF input capacitance
- 20 MΩ input resistance (when terminated into 1 MΩ scope input)
- 400 V CAT I and 300 V CAT II maximum input voltage
- Scope compensation range: 10 – 25 pF
The N2875A passive probe offers DC to 500 MHz and 20:1 attenuation factor to address a wide range of measurement needs.
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
The sharp probe tip is spring loaded to help engineers keep the probe from slipping off the device under test. Insulating IC caps keep the small probe tip centered on the IC lead and keep it from shorting adjacent leads. Standard flat blade ground connector and self-adhesive copper ground pad help reduce ground inductance while offering easy ground access. Optional probe tip accessories provide specialized capabilities for demanding applications.
Compatible with Keysight InfiniiVision and Infiniium Series oscilloscopes with 1 MΩ input.
Extend The Capabilities
Featured Resources
Want help or have questions?
Entdecken
- © Keysight Technologies 2000–2023
- Datenschutz
- Sitemap
- AGBs
- Markenanerkennungen
- Feedback