Keysight DDR Logic Analyzers

Keysight DDR Logic Analyzers provide modular high-speed memory protocol testing and debugging capabilities for DDR and LPDDR system validation.

How to Analyze Signal Integrity in DDR Memory

New InfiniiScan software helps save time by eliminating the need to isolate read-write signals to analyze signal characteristics in DDR memory. Learn how!

DDR and DDR Simulation based compliance tests

Due to ever increasing data rates there is less design margin given to memory design engineers. You will have to make sure that your implementation is compliant to specifications. In this webinar, we will walk through the compliance tests and design exploration with several memory standards.

DDR Technology Testing Solutions

High-speed technologies such as double data rate (DDR) and low-power double data rate (LPDDR) carry significant design and test challenges. DDR is a memory chip technology that has progressed through multiple generations in the past 10 years. Each DDR generation improves in speed, efficiency, and memory capacity. But as the standard allows for more data transfer at faster rates, margins decrease. Therefore, design work and testing have become more challenging. Bit error rate testers (BERTs), oscilloscopes, probes, and associated compliance software alleviate some of the challenges when working on the physical layer. For a deeper analysis of the OSI layers, logic analyzers can help you test and debug your designs for functional and protocol compliance.Depending on where you fit in the design stage (device characterization, simulation, prototype, firmware, software), here are three types of tests essential to validate the current and next-generation DDR:• DDR5 receiver conformance and characterization • physical-layer and compliance testing• functional debug, analysis, and protocol compliance

How to Efficiently Build and Analyze Memory Bus to Meet DDR Specification

In this webinar, we will discuss the importance of memory channel pre- and post-layout models, how to build them, and how to optimize them to meet design targets.

DDR Memory Design and Test Overview

Brief overview of Keysight solutions for DDR design and test.

Digital Protocol Analyzers Catalog

Explore the comprehensive range of Keysight digital protocol analyzers engineered to capture, decode, and validate high‑speed digital interfaces. This catalog highlights portable logic analyzers, DDR memory analyzers, and PCIe/CXL protocol solutions across multiple performance classes for embedded design, memory validation, and serial protocol compliance testing.

DDR Memory Overview, Development Cycle and Challenges

This paper gives an overview of DDR memory, DDR interfaces, and outlines techniques to overcome common DDR validation challenges to improve signal performance.

W2309EP/ET DDR Bus Simulator and W2317EP/ET DDR Bus Simulator Distributed Computing 8-pack

The W2309EP DDR Bus Simulator quickly generates accurate BER contours, masks, and margins between the two, for the DDR memory bus specification published by JEDEC.

Separating Read and Write Signals for DDR DRAM

Keysight InfiniiScan provides a new innovative method for separation which allow you to quickly and reliably separate read and write signals for DDR DRAM. Learn more.

DDR Memory is Everywhere

Find out why data centers need to move to DDR5 memory

DDR and DDR2 – Debugging Intermittent Memory Failures

Learn how to validate and debug high-speed memory systems and find root cause of intermittent memory failures in DDR and DDR2 systems.

DDR Probing for Physical Layer and Functional Testing

Probing is the key to accessing signals and validating your designs. Although, you may normally probe at signal vias or designed-in probe points, for DDR these do not always provide good signal integrity.

DDR Memory Design and Test – A Better Way

Keysight offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

Debugging Signal Integrity and Protocol Layers on DDR Designs

As DDR data transmission rates increase, signal integrity and clarity become critical concerns. Learn to resolve debugging failures – one of the primary challenges with DDR.

Separating Read & Write Signals for DDR DRAM & Memory Controller

See how InfiniiScan oscilloscopes help you to easily separate read and write signals in DDR RAM and the memory controller to solve test problems.

Modifying DDR Libraries for Silicon Nail Test Generation

Find how to modify DDR libraries for silicon nail test generation on the Keysight x1149 boundary scan analyzer. Explore the nail test generation procedures!

Keysight DDR Memory Analysis Software Guided Demo

Explore the Keysight DDR Setup Assistant. Learn to tune your logic analyzer for DDR/LPDDR memory traffic with a guided step-by-step demo, ensuring accurate measurements and efficient setup.

Identifying the Causes of DDR Data Corruption and Elusive Failures

The protocol-decode software allows you to track and fix infrequent glitches and other signal anomalies that might otherwise be difficult to find.

DDR Memory Test Challenges from DDR3 to DDR5

From DDR3, DDR4 and DDR5, learn the progression of the technology, how tests have evolved, and the test equipment that can help combat challenges.