Keysight W7801B New De-Facto Standard Software for B1530A (WGFMU)

Keysight W7801B New De-Facto Standard Software for B1530A (WGFMU)

Application Notes

Keysight LF Noise Measurement Solutions

As LF (Low Frequency) noise of semiconductor devices affects the circuit performance, LF noise becomes a critical parameter of advanced process technology. The most well-known characteristics related to LF noise of the circuit performance are phase noise and jitter for analog circuits and digital circuits, respectively. LF noise is composed of flicker noise, 1/f noise, and RTN (Random Telegraph Noise). It is very important to accurately measure the LF noise of semiconductor devices to optimize circuit performances. The LF noise measurement systems, B1530A(WGFMU) and E4727B provided by Keysight are a turnkey solution.

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