Choose a country or area to see content specific to your location
Application Notes
Keysight LF Noise Measurement Solutions
As LF (Low Frequency) noise of semiconductor devices affects the circuit performance, LF noise becomes a critical parameter of advanced process technology. The most well-known characteristics related to LF noise of the circuit performance are phase noise and jitter for analog circuits and digital circuits, respectively. LF noise is composed of flicker noise, 1/f noise, and RTN (Random Telegraph Noise). It is very important to accurately measure the LF noise of semiconductor devices to optimize circuit performances. The LF noise measurement systems, B1530A(WGFMU) and E4727B provided by Keysight are a turnkey solution.
Unlock Content
Sign up for free
*Indicates required field
Thank you.
Your form has been successfully submitted.
Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.