Choose a country or area to see content specific to your location
What are you looking for?
WirelessPro empowers you to model, simulate, and analyze various aspects of 5G networks, 5G Advanced technologies, and future 6G wireless channels with unparalleled ease and accuracy.
Get faster, clearer insights with our new multicore, 12-bit oscilloscope up to 33 GHz.
Emulate every part of your data center infrastructure. Emulate Anything. Optimize Everything.
Accelerate signal analysis testing with Keysight’s VSA software. Visualize, demodulate, and troubleshoot with over 75+ signal standards with precision.
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
Achieve fast, accurate board-level testing with robust inline and offline ICT designed for modern manufacturing.
Explore curated support plans, prioritized to keep you innovating at speed.
Pinpoint interference with post-processing spectrum management software in the lab.
Our high-density ATE power supplies end trade-offs between test throughput and precision.
Explore engineer-authored content and a vast knowledge base with thousands of learning opportunities.
Keysight Learn offers immersive content on topics of interest, including solutions, blogs, events, and more.
Quick access to support related self-help tasks.
Additional content to support your product needs.
Explore services to accelerate every step of your innovation journey.
Explore the complete portfolio of Keysight accessories designed to complement and extend your instruments. Use the filters below to quickly find compatible accessories such as modules, cables, adapters, and other system components to configure, expand, and optimize your test system for your specific measurement needs.
No Filter available
No Filter available
E364SNP
The Keysight E364SNP series and parallel kit works with the E36441A Series power supplies, enabling safe and easy series or parallel connections.
The Keysight E364SNP series and parallel kit is a simple, safe, and convenient solution for achieving series and parallel connections. With this kit, you can do the following:
Y1253A
Y1253A prototyping board with 1 inch of signal header breakout pins allows users to access individual single pins for prototyping or debugging.
Use the Y1253A evaluation and prototyping board allows users to access individual single pins for prototyping or debugging. This is an M9195A/B PXIe DSR accessory.
U1880A
Deskew the time delay between voltage and current probes, driving both probes with the same pulse signal
For accurate power measurements, it is extremely important to equalize the time delay between voltage and current probes. The U1880A deskew fixture allows you to drive both your voltage and current probes with the same pulse signal. Probe deskew can then be performed with the power measurements application software, or may be performed manually on the oscilloscope.
E2649B
Perform high speed USB 2.0 testing. E2649B USB 2.0 High-Speed Fixture Set includes four test fixtures; Device Signal Quality test fixture, Host Signal Quality test fixture, Device Receiver Sensitivity test fixture and Host Disconnect test fixture.
E2649B USB 2.0 High-Speed Fixture Set test fixture for:
Required for D9010USBC USB 2.0 compliance test software. Compatible with Infiniium 8000, 9000, 80000 and 90000 Series oscilloscopes.
U7242A
Access the transmitter and receiver measurement points required for easy and accurate USB 3.0 compliance testing.
The U7242A USB 3.0 test fixture will help simplify the USB 3.0 measurement process by providing access to the transmitter and receiver measurement points required for USB 3.0 compliance testing. It has been designed for direct SMA connections for easy and accurate measurements with direct connections to the oscilloscope and J-Bert SMA connections. It also includes probing connections for InfiniiMax active differential probes for the characterization and testing of active bus signaling of USB 3.0 and USB 2.0 traffic.
N7015A
Delivers up to 30 GHz of de-embeddable bandwidth, enabling signal verification and debug of USB Type-C and other standards
The N7015A type C test kit provides performance up to 30 GHz of de-embeddable bandwidth, enabling signal verification and debug of USB/DP/Thunderbolt designs and other high-speed signal standards to support type C connectors.
The N7015A high-speed USB type C fixture breaks out 4 lanes of high-speed signals for signal measurement or injection as well as low-speed power and control lines to a secondary fixture (N7016A) for monitoring and control. The flexible fixture kit enables signal accessibility and probing to the USB device, host (upstream and downstream) ports. The N7016A low-speed fixture manages power and control lines from the N7015A to support termination requirements, and test configuration as well as connection to a power delivery controller.
It comes with the form factor to fit two fixtures side-by-side and/or top-and-bottom. Whether connected side-by-side or stacked, the fixtures meet the minimum spacing allowed for in the specification. Durable fixture design ensures multiple connections and disconnections without failure in an active test environment.
See also N7015A/N7016A USB Type-C Interconnect Assembly Controller Software
16454A
Measure the accurate permeability of toroidal-shaped materials in a wide range of sizes.
Frequency:
1 kHz to 1 GHz
Sample Size (Toroids Only):
height: ≤ 8.5 mm
inner diameter: ≥ 3.1 mm
outer diameter: ≤ 20 mm
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
For more information about Material Testing Equipment, please visit Materials Test Equipment and LCR Meter & Impedance Measurement Product Accessories
16451B
Evaluate the dielectric constant of solid dielectric materials; complies with ASTM D150
Frequency:
≤ 30 MHz
Measurement parameters:
capacitance (C), dissipation factor (D), and dielectric constant (εr', εr'')
Material-under-test size:
thickness: ≤ 10 mm
diameter: 10 to 56 mm
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
For more information about Material Testing Equipment, please visit Materials Test Equipment.
Learn more about LCR Meter & Impedance Measurement Product Accessories
16453A
Eliminate stray capacitance by measuring the dielectric constant of solid materials using the parallel plate method.
Frequency:
1 MHz to 1 GHz
Sample size (smooth sheets only):
thickness: 0.3 mm to 3 mm
diameter: ≥ 15 mm
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixture, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixture has a flexible electrode that adjusts automatically to the material surface.
For more information about Material Testing Equipment, please visit Materials Test Equipment.
Learn more about LCR Meter & Impedance Measurement Product Accessories
N1428A
Comes with two component modules that can hold SMDs, leads, and various types of devices
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
N1295A
N1295A device/component test fixture provides a low-cost solution to quickly and easily test packaged devices and components; designed for the B2900A series.
The Keysight N1295A device / component test fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B test fixture provides more capabilities.
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
The 16034E test fixture is designed for impedance evaluations of SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1.6(L) x 0.8(W) mm.
Learn more about Keysight LCR Meter & Impedance Measurement Product Accessories