Column Control DTX

Four Functions that Enhance Your Network Analysis



Gone are the days of simple design and straightforward test. Smaller, more integrated devices drive up R&D and manufacturing device test times, slowing your time to market. Tests requiring multiple instruments and fixtured test methods are inevitable, and these tests slow R&D and manufacturing test to a crawl. Setting up, configuring, and calibrating multiple instruments is a complex, expensive, and slow process that can take hours just to execute one test on one device.


There is a better way.


A network analyzer that performs multiple accurate measurements on a single connection saves time and simplifies your processes. Advanced network analyzer capabilities and options can help you stay ahead of the curve characterizing modern devices.


Explore how the following advanced network analyzer functions enable you to meet the challenges of modern device test:

  • Time domain
  • Spectrum analysis
  • Gain compression
  • Automatic fixture removal


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Column Control DTX