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  • A400GE-QDD

A400GE-QDD 4-Port Layer 1 BERT QSFP-DD Test System

The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.

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  • Interface

    QSFP-DD

  • Interface speed modes

    400G

  • Protocol support

    Ethernet

  • Ports

    4

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Highlights

The Keysight A400GE-QDD four-port test system enables you to validate the bit error rate (BER) performance of high-port-count devices using the KiOS browser-based single-page application. Using the test system, you can also do the following:
  • Identify issues quickly with KiOS. The application offers a system-wide view of bit error rate testing (BERT) and forward error correction (FEC) statistics across all lanes. It supports 1 x 400GE, 2 x 200GE, 4 x 100GE, and 8 x 50GE speeds.
  • Measure BER and FEC performance in minutes instead of hours. Evaluate new optical transceivers and copper cable interconnects at all Ethernet speeds simultaneously using the Enhanced BERT option.
  • Easily generate pass / fail test reports and conduct long-duration (timed) and stress tests using Keysight KP4 FEC symbol bit error distribution analysis to detect bursty and thermal errors over time.
  • Simplify connections between the A400GE-QDD and the Keysight M8040A BERT analyzer, as well as your development boards, using optional host and module compliance boards, cables, and adapter bundles.
  • Leverage field-proven technology built on two generations of 400GE QSFP-DD test systems.

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