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On-Wafer Test of Power Devices
Reduce your Development Time for Power Devices with On-Wafer Test
The combination of the Keysight B1505A and FormFactor’s Tesla system provides the capabilities you need in a system designed specifically for power devices. With the Tesla system you can migrate your characterization from in-package to on-wafer test, optimize your development process and, as a result, reduce the product development time for your power devices.
- On-wafer test of power devices
- Reduce the development time for power devices
- Supports probing at up to 3,000 V, 100 A and 100 W/cm2
- Light curtain and interlocks for operator safety
- Advanced chuck mechanism for low contact resistance and low noise
- Uses Keysight B1505A power device analyzer/curve tracer
- Request more information and Keysight’s partner, FormFactor, will contact you to discuss your requirements in more detail.