H7230A-555 i3070 Family Multiplexed User Fundamentals Class II

About This Class

This training builds on the fundamentals covered in i3070 Muxed User Fundamentals Class I and provides a deeper understanding of the Keysight i3070 test development process.

The class focuses on more advanced and customized test development using the i3070 Multiplexed Board Test system. You will gain hands-on experience creating custom digital, powered analog, mixed signal, and digital cluster test libraries, as well as developing and debugging Boundary Scan tests and FlashRAM programming and tests using Flash70.

You will also learn how to customize test and fixture files, use advanced test development tools, and apply the Engineering Change Order (ECO) process. Typically, Class I and II are taken consecutively.

Prerequisites

• Completion of H7230A-500: i3070 Muxed User Fundamentals Class I

Outline

• Reinforce the i3070 test development process
• Complete the board description from translated CAD data
• Create custom digital libraries for devices without existing Keysight libraries
• Create custom digital cluster test libraries using the PCF language
• Create custom powered analog and mixed signal test libraries
• Generate customized test and fixture files
• Program and test FlashRAM devices using Flash70
• Understand and develop IEEE 1149.1 Boundary Scan tests
• Work with Boundary Scan test types, including Powered Shorts, In-circuit, Integrity, Connect, BusWire, Interconnect, and Silicon Nail
• Introduction to Cover Extend Technology combining Boundary Scan and VTEP
• Introduction to Advanced I/O Boundary Scan testing, including IEEE 1149.1 Differential Pair and IEEE 1149.6 AC-coupled testing
• Turn on and debug unpowered tests using the Keysight Engineer Interface
• Turn on and debug powered and custom tests using Keysight PushButton Debug
• Apply the Engineering Change Order (ECO) process
• Manually develop a test for a small board to reinforce the development process and explore alternative development tools

Who Should Attend

Engineers and technicians responsible for developing test programs on the Keysight i3070 Multiplexed Board Test system who have completed the i3070 Muxed User Fundamentals Class I and want to expand their knowledge of customized and advanced test development.

What You Will Learn

By the end of the class, you will be able to:

• Apply more advanced and customized test development techniques on the Keysight i3070
• Complete a board description from translated CAD data
• Create custom digital test libraries for devices without existing Keysight libraries
• Develop custom digital cluster test libraries using the PCF language
• Create custom powered analog and mixed signal test libraries
• Generate and customize test and fixture files
• Program and test FlashRAM devices using Flash70
• Understand and develop IEEE 1149.1 Boundary Scan tests
• Develop and debug Boundary Scan tests, including In-circuit, Interconnect, Connect, Powered Shorts, BusWire, and Silicon Nail
• Understand the concepts of Cover Extend Technology and Advanced I/O Boundary Scan testing
• Turn on and debug unpowered tests using the Keysight Engineer Interface
• Turn on and debug powered, custom library, and Boundary Scan tests using Keysight PushButton Debug
• Apply the Engineering Change Order process to existing board tests
• Manually develop a board test and use alternative test development tools