Photonics IC Functional Test
Solution Briefs
Keysight’s Photonics IC Functional Test solution provides an integrated and automation-ready platform for validating the performance of photonic integrated circuits (PICs). As PICs become increasingly important in data communications, sensing, and advanced computing, engineers require precise and scalable measurement solutions to characterize optical and electrical device behavior accurately. Traditional test approaches often involve multiple standalone instruments and manual alignment processes, increasing complexity, measurement uncertainty, and test time.
The solution combines tunable laser sources, optical power meters, polarization control, and electrical measurement capabilities into a unified workflow. Engineers can perform high-resolution swept wavelength measurements to evaluate insertion loss, polarization dependent loss, and spectral characteristics of PIC components such as waveguides, resonators, and grating couplers. Automated polarization control simplifies TE/TM analysis and reduces manual intervention, while integrated source measurement units enable accurate characterization of active devices such as PIN photodiodes through responsivity and dark current measurements.
By automating calibration and measurement workflows, Keysight improves repeatability, accelerates validation cycles, and supports scalable testing from early-stage research and development to high-volume wafer-level manufacturing.