Integrated Photonics Test
Silicon Photonics - Efficient Wafer Level Test
Integrated Photonics, often called Silicon Photonics, promises additional benefits for industrial segments such as Intra Data Center communication and Data Center Interconnects (DCI), Telecom, 5G and Automotive connectivity, High Performance Computing, LIDAR, Sensing and Medical. Notably, optical components for the datacenter infrastructure design margins and low energy consumption targets are getting under pressure with higher data rates. This adds various forms of device integration.
Integrated Photonics Test Solution Combining Measurement
Keysight provides test solutions for silicon photonics wafer test:
Keysight’s Photonic Test Solution integrated with PathWave Test driver plugins for instrument and wafer probe control enables.
Optical Measurement Solutions Tunable laser instruments are used for spectral measurements of optical components and materials. The wavelength dependence is rapidly determined with selectable and very high wavelength resolution. The measurement systems can be flexibly configured to match the requirements of the application. Here we suggest some examples.
Insertion loss measurement (IL)
Combining one or more optical power meters with the tunable laser source (TLS) permits measurement of optical power vs. wavelength. Often this is used to find the ratio of power at the input of a component to the output power, commonly called insertion loss and expressed in dB. While the TLS tunes the wavelength over the chosen range, the power meters periodically sample the power for the desired number of measurement points. These samples are synchronized with the TLS sweep by a trigger signal for accurate association with the corresponding wavelength. Use of multiple power meters allows simultaneous measurement of outputs from multiport components like multiplexers, splitters and wavelength switches. Reflection spectra (return loss) can also be measured, by adding the 81610A return loss module. A setup can combine the 81606A, 81607A or 81608A TLS with power meters from the 816x-series modules or the N774x-series multiport power meters and the free N7700 IL software. Faster sweep speeds, sampling rate and scan repetition are achieved using the N7700 FSIL software option.
High wavelength accuracy and repeatability, particularly during fast wavelength scans, is assured with the built-in wavelength monitoring in these laser sources. These “lambda-logging” data are synchronized with the measurement triggers to the power meters. For highest absolute and relative wavelength accuracy the monitor is calibrated with a built-in gas cell reference and uses fast sampling to support the high sweep speeds. InGaAs power detectors are best for such measurements due to the small variation in responsivity over the single-mode fiber wavelength range (1260 to 1630 nm), the high sensitivity and dynamic range. The N7744A and N7745A power meters are especially well adapted to these swept-wavelength measurements with fast sampling rates and high signal bandwidth that allow high-resolution measurements at high sweep speeds without distortion of the measurement trace.
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