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Application Notes
There are two general methods for measuring the polarization dependent insertion loss (PDL) of a fiberoptic component, which are standardized in the IEC document 61300-3-2 as the all-states method and the Mueller Matrix method. In the all-states method, the optical test signal to the device under test is varied through a sufficiently large sampling of all possible polarization states such that the relation between the maximum and minimum optical power at the device output represents the PDL with the necessary accuracy. For the Mueller Matrix method, a limited set of known polarization states, typically 4 or 6 states, are applied to the DUT and matrix analysis of the output power levels is used to determine the maximum and minimum power that would be found by scanning all of the possible states. This is generally faster and is well suited for spectral measurements with continuously swept tunable lasers. However this method requires instrumentation that accurately sets specific states of polarization and somewhat more advanced control programs for derivation of the results.
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