E6680A Wireless Test Set

• Look to the future with a wideband test solution for Wi-Fi 6E and 802.11be devices
• Maximize throughput with 32 ports for multiple AP or STA
• Simplify Wi-Fi 6E test with an easy-to-use solution covering 2.4, 5, and 6 GHz
• Verify WLAN/5G CPE

Keysight’s E6680A is the solution to test WLAN devices today and tomorrow. Ready for the future with up to 800 MHz bandwidth, it analyzes the 320 MHz signals defined for IEEE 802.11be. The E6680A maximizes throughput without sacrificing flexibility using up to 32 ports to test multiple WLAN AP or STA. Verify Wi-Fi 6E in the new 6 GHz band along with Wi-Fi 6 and legacy Wi-Fi in the 2.4 GHz and 5 GHz bands without changing DUT connections. All ports support all bands and are configurable as half duplex or full duplex. Use the E6680A to verify devices such as CPE that support WLAN and 5G, also 4G and additional wireless connectivity technologies Bluetooth 5.1 and IEEE 802.15.4 PHY including Zigbee.

The E6680A application software is familiar and industry proven. Test WLAN devices confidently with Keysight’s common measurement algorithms and waveforms. Chipset control, automation, and sequencing make it easy to optimize throughput during design verification and manufacturing. Minimize test development time by re-using existing code from other Keysight non-signaling platforms such as the M9421A VXT PXIe Vector Transceiver. Making startup quick and painless, a controller is embedded within the E6680A solution. Software licenses and applications are loaded before shipment – just plug it in, switch it on, and you are ready to test.

Keysight’s E6680A Wireless Test Set hardware is optimized for WLAN design verification and manufacturing test. The hardware and software support:

• 200, 400, or 800 MHz bandwidth
• 380 MHz to 6 GHz or 7.3 GHz frequency ranges
• IEEE 802.11a/b/g/j/p/n/ac/af/ah/ax, Bluetooth 5.1, 802.15.4, 5G NR, 2/3/4G
• Up to 4096QAM
• MU-MIMO and OFDMA with statistics and RF performance for each user
• Up to 4x4 MIMO, extensible to 8x8 MIMO
• Power, transmit spectral mask, spectral flatness, EVM measurements and analysis