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Boundary Scan Test Modules for PCIE Loopback Test

Boundary Scan Test Modules for PCIE Loopback Test

Data Sheets

Boundary Scan Test Modules

for PCIe Loopback Test

Keysight Boundary Scan PCIE loopback test modules

  • Tests PCIe high-speed signals to CPU or other PCIe devices using IEEE 1149.1 and IEEE 1149.6 loopback tests
  • Enables Signal testing using 1149.1 interconnect
  • Performs power tests and GND pins for opens on PCIe connector
  • PCIe test cards are available in assorted sizes; usable in both manual and auto-insert mode of operation:
  •  x8 – 96 pins
  • x16 – 168 pins
  • Additional sizes and custom pinouts for Riser card are available upon request

Benefits

  • Easy to use
  • Quick test development in minutes using library package
  • Fast turn-on and easy debug with x1149 debug tools
  • Covers power and all ground pins connectivity for highspeed signal return; critical for high-speed signal integrity

Features of PCIe x16

  • Quickly tests PCIe differential interface signals on PCIe plug-in cards by looping back Tx to Rx
  • Easy connectivity since they are gold finger bare board; no need to test power and GND pin
  • Requires IEEE 1149.6 boundary-scan cell on the PCIe interface chip to test PCIe differential signals using IEEE 1149.6 interconnect test for AC coupled nodes
  • Use with Keysight i3070

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