i7090 Massively Parallel Board Test System

Introduction

The Keysight i7090 board test system offers one of the best solutions for you to rapidly and costeffectively test today's highly panelized printed circuit boards (PCBs). With up to 20 parallel test cores and 160 simultaneous flashing channels, it gives you the flexibility to customize the system to meet your business needs. It also comes with a cost-effective testhead that has up to 2560 ICT test pins and an 18slot PXIe instrument chassis. The 600mm test head encloses the module cards that contain the tester's hardware resources, the DUT power supplies, and the system controller, which contributes to the system's compact footprint.

The Keysight i7090's future-proof design lets you add new hardware and software capabilities over time, which could help you to maximize the throughput and preserve your investmen

Keysight i7090 System Summary

Full System Node Capability

• 20 x 128-pin Parallel ICT Cores for Highest-Speed Panel Test user-configured core combinations up to a single 2560 pin core

Full System Opens Test Capability

• NanoVTEP Vectorless Test EP

• Opens test for ICs, connectors, switches, fuses

Full System Analog Capability

• 2560 analog nodes

• Shorts test programmable threshold: 2-1000 Ω

• Resistance 

• Capacitance 

• Inductance 

• Diode, transistor, FET, fuse, jumper, switch, potentiometer measurements

• NanoVTEP Vecterless test open detection

Controller

• PC Running Windows 10 64-bit (Professional Edition)

Optional System Accessories

• Laser bar code reader

• Programmable DUT power supply

• High-current and high-voltage power supplies

• Polarity Check Technology

• In-System Programming o Flash ISP o Microcontrollers o PLD ISP

• Pin Verification Fixture

System Architecture

• Tester resources are located directly behind the fixture interface for optimum performance

• Small system footprint, 600 mm in width, saves space and cycle time.

• High to ultra-high volume manufacturing reduces system investment and supports production test times as needed.

• Unpowered and vectorless test extended performance (Nano VTEP) technologies for rapid test throughput and high fault coverage.

• Instrument integration with Keysight OpenTAP software, within the same platform, for efficient functional test measurements and PXI support for Keysight and 3rd party instruments.

• Programming function integration provides in-system programming with 160 channels in parallel, increasing system throughput.

• Build on CFX/Hermes and Keysight Pathwave to target Industry 4.0

This board test system consists of a testhead, a testhead controller, and a board handler. The system is built on a modular, parallel architecture that allows for future expansion while maintaining parallel test capability for optimum test speed. The hardware architecture of the system includes the following features:

• Up to 20 individually controllable pin cards (for up to 2560 nodes or 20 cores) and a variety of module cards for fast upgrades as test needs change

• Combine cores to test high-pin-count boards

• Run cores in parallel to test up to 20 PCBs simultaneously

• Built-in testhead LAN for high-performance testhead-to-controller communication