Characterize Wide Bandgap Semiconductors

Keysight’s all-in-one test solution helps you characterize wide-bandgap semiconductors using a double-pulse testing system to ensure a safe environment for users.

B1500A Semiconductor Device Analyzer

This technical overview describes the complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement using the B1500A semiconductor device analyzer.

B1500 Semiconductor Device Analyzer

This set up guide provides information on how to make a configuration for B1500A Semiconductor Device Analyzer

B1500A Semiconductor Device Analyzer

This paper demonstrates the capabilities of Keysight’s B1500A new WGFMU module to solve ultra-fast 1 µs NBTI measurement challenges without external equipment.

Semiconductor ATE Vendor Prepares for 5G

A supplier of semiconductor automated test equipment integrated a Keysight vector transceiver into its new system design to give it a roadmap to 5G.

Keysight Semiconductor Teaching Lab Solutions

The Keysight Semiconductor Teaching Lab Solution, comprising UU101LAB, UU102LAB, and UU103LAB, is a comprehensive solution designed to bridge semiconductor theory with hands‑on measurement practice. Ideal for undergraduate and postgraduate semiconductor education, the Keysight Semiconductor Teaching Lab Solution empowers educators to deliver experiential learning while equipping students with skills to thrive in the highly semiconductor sector.

Semiconductor Learning Hub

Keysight helps semiconductor industry leaders to accelerate innovation from design to manufacturing. Learn how RF- centric design tools can optimize the efficiency of physical, circuit, and system design with the resources in Keysight's semiconductor learning hub.

Improving Reliability of Semiconductor Devices

Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

B1500A Semiconductor Device Analyzer

This technical overview describes the use of the B1500A for pulsed IV measurements using the B1500's 50us pulsed MCSMU.

B1500A Semiconductor Device Parameter Analyzer

The Keysight B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Keysight’s new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Keysight B1500A can be used for a wide range of semiconductor device characterization needs.

B1500A Semiconductor Device Analyzer

This configuration guide will help you choose options for configuring B1500A for your device characterization.

Automotive Power Semiconductor: Design and Testing Landscape

Discover the latest trends in automotive power semiconductors, industry challenges in design and testing, the evolution of power semiconductor testing, the impact of SiC and GaN on EV powertrains, and new testing and regulatory requirements from industry associations and bodies like JEDEC, IEEE, and AEC.

Dynamic Characterization of a Power Semiconductor Bare Chip

This white paper describes the challenges of making dynamic measurements on a bare power semiconductor chip and how Keysight overcomes these challenges using various, unique technologies.

Measuring CNT Structures Using a Semiconductor Analyzer

The B1500A semiconductor device analyzer and the 4156C precision semiconductor parameter analyzer provide an electrical measurement solution for CNT structure characterization.

Semiconductor Manufacturer Selects the New 34461

This success story discusses how a semiconductor manufacturer likes the familiarity and enhanced features of the new 34461A DMM.

Empower Semiconductor Teaching by the Digital Learning Suite

With the emerging talent’s gap in semiconductor industry, Keysight Digital Learning Suite (DLS) brings new experience for semiconductor learning and teaching. In this application note, we will introduce how to measure IV curve of a MOSFET with industry-grade Source / Measure Unit (SMU) and create a test automation plan in DLS.

Semiconductor/IC Design and Test in Research and Teaching

Delve into the symbiotic importance of IC test and measurement in the world of integrated circuits and use the suggestions provided in this brochure to set up a first-rate semiconductor/IC teaching lab.

Semiconductor Teaching Lab Solution: Basic Design and Measurement

The Semiconductor Teaching Lab Solution is a comprehensive, hands-on educational platform designed to bridge the gap between theory and practical skills in semiconductor engineering.

GaN Power Semiconductor Device Dynamic Characterization

Gallium nitride (GaN) power semiconductor field effect transistors (FET) pose difficult design and test challenges due to its higher frequency operation and multiple variations of technology. This article discusses how to overcome GaN FET dynamic characterization challenges.

Electronic Components Semiconductor/Transistor Evaluation

Semicon