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NX5402A Silicon Photonics Wafer Test System
One-stop, fully automated and volume production-ready Silicon Photonics wafer test solution with guaranteed system performance
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Highlights
Key Specifications
Maximum Number of SPGU output channels
n/a
Maximum Number of Measurement Pins
12 (optical in), 12 (optical out), 30 (electrical)
Minimum Current Measurement Resolution
n/a
Minimum Voltage Measurement Resolution
n/a
Parallel Parametric Test Capability
No
Maximum Number of SPGU output channels
Maximum Number of Measurement Pins
Minimum Current Measurement Resolution
Minimum Voltage Measurement Resolution
Parallel Parametric Test Capability
n/a
12 (optical in), 12 (optical out), 30 (electrical)
n/a
n/a
No
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Additional Features:
n/a
Form Factor:
n/a
Maximum Number of Measurement Pins:
12 (optical in), 12 (optical out), 30 (electrical)
Maximum Number of SPGU output channels:
n/a
Minimum Current Measurement Resolution:
n/a
Minimum Voltage Measurement Resolution:
n/a
Parallel Parametric Test Capability:
No
Type:
Silicon Photonics Wafer Test Solution
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