Generate Performance-Optimized RF Signals Using Waveform Filtering
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Engineers regularly encounter new challenges in the design and test of their modern radio-frequency (RF) devices as they work to ensure compliance with the latest complex standards. This is especially true for RF devices that must achieve test specifications for in-channel and out-of-channel performance.
RF device test challenges include making accurate RF power measurements and identifying and solving interference and signal integrity problems. Engineers must be confident that the results of the RF test measurement reflect the device’s performance rather than the signal generator’s or signal analyzer’s performance. To ensure that measurement results accurately portray the RF device’s performance, the test system must outperform the device under test (DUT).