Functional Interconnect Test Solutions 8 Channel Validation
Demos
The demonstration begins with a phase-noise comparison. Phase noise close to the carrier and through the pedestal region can affect measurements in which source noise competes with low-level DUT behavior. The side-by-side measurement illustrates the difference between the two signal generators and demonstrates how reducing source phase noise can provide additional measurement margin. This is particularly relevant when characterizing the residual noise of amplifiers and other components, where the test source must be sufficiently clean to avoid limiting the measurement.