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Tips: How to Optimally Measure LF Noise

Tips: How to Optimally Measure LF Noise

Application Notes

Best Solution for LF Noise Measurement

The Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) allows measurement of the

LF (Low Frequency) noise of semiconductor devices very easily. The E4727B consists of hardware and

software. Users can measure LF noise by just entering the expected measurement conditions and the

software will then set all parameters of hardware optimally. However, in some cases results are more

reasonable if more optimal conditions for external resistor RLOAD, LPF type, or LNA type can be set.

This Application Note shows how to improve LF noise measurement data by setting optimal conditions.

E4727B Specifications

• Frequency range: 30 mHz – 100 MHz

• LNA Noise Floor: -185 dBV2 / Hz

• LNA Corner Frequency: 15 Hz

• External Resistor Values: 0 Ω – 100 MΩ

• Minimum SId: 1E-28 A2 / Hz (Typ)

• Minimum Bias Current: 30 pA (Typ)

• Maximum Drain DC Bias: ± 200 V / ± > 0.1 A

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