Enhanced Short Tests for High Impedance Nodes

Application Notes

This application note introduces an Enhanced Short Test algorithm tailored to tackle the testing challenges associated with high-impedance nodes in Printed Circuit Board Assemblies (PCBAs). Integrated into the Keysight In-Line High-Density In-Circuit Test (ICT) system, the Enhanced Short Test significantly boosts the efficiency of short detection for high-impedance nodes, leading to a noteworthy 57% reduction in testing time. High-impedance nodes, commonly found in modern PCBAs to enhance signal quality and reduce power consumption, present difficulties such as extended stabilization times, heightened sensitivity, diminished current flow, intricate isolation procedures, and concerns regarding signal stability.

Unlock Content

*Indicates required field

Change email? Email*Required Field

First name*Required Field

Last name* Required Field

Country/area*Required Field

Company*Required Field

Industry*Required Field

Years of experience*Required Field

Job level*Required Field

Job responsibility*Required Field

Job role*Required Field

Send me email updates about new products, resources, and events

Are you interested in speaking with a salesperson? Not at this time Yes

Select a preferred method of communication*Required Field

Select a preferred method of communication

Phone*Required Field

Please have a sales representative contact me. Learn

By continuing, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you

Your form has been successfully submitted.

Your access will reset once your browser cookie expires, or browser cache is cleared. To regain access to the content, simply sign-in again.

Please have a salesperson contact me.

*Indicates required field

Select a preferred method of communication*Required Field

Change email? Email

Phone*Required FieldPlease enter a valid phone number without spaces or special characters.

Send me email updates about new products, resources, and events

By continuing, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you

A sales representative will contact you soon.

What are you looking for?

Welcome

Enhanced Short Tests for High Impedance Nodes

What are you looking for?