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XN8-class Vector Network Analyzer, 50 GHz Maximum frequency

With the source-per-port PNA-X pro network analyzer, consolidate your design verification process, reduce your test cycle time, and minimize your potential errors. The source-per-port PNA-X pro network analyzer simplifies testing of complex active components, like frequency converters and differential amplifiers, by incorporating up to four ultra-low phase noise and harmonic signal sources, two low-noise receivers, and two combiners in a single setup. This configuration reduces the need for extensive cabling and minimizes signal power losses during high-power testing. The integrated hardware eliminates the necessity for external signal generators and switches, streamlining the test setup.

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  • Maximum frequency

    50 GHz

  • Number of built-in ports

    2, 4

  • Maximum number of sources

    4

  • Integrated low-noise receivers

    2

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Highlights

Reach for unrivaled excellence with the Keysight PNA-X pro network analyzer. This versatile microwave test engine delivers precise linear and nonlinear measurements with advanced error correction in a simplified setup with an intuitive interface.

Simplify frequency-translating component testing with the source-per-port PNA-X pro. This highly configurable instrument includes up to four ultra-low phase noise and harmonic signal sources, two low-noise receivers, and two combiners in a single test setup. Switchable front-panel loops on the source path and direct receiver access reduce the cabling required for complex high-power testing — and the associated signal power losses. Additionally, this integrated hardware eliminates the need for external signal generators and switches in the test setup. Consolidate your design verification setup while minimizing test cycle time and the potential for errors with the PNA-X pro. 

  • Simplify your measurement setup for frequency-translating and differential active devices using four integrated, independent signal sources with ultra-low phase noise direct digital synthesis RF.
  • Eliminate the need for external switches to reverse the direction of your device under test during noise figure and intermodulation distortion (IMD) measurements using two integrated low-noise receivers and signal combiners.
  • Improve measurement dynamic range by leveraging preselection filters built into the integrated low-noise receivers.
  • Minimize the cabling required for complex device testing using the highly configurable test set architecture, including front-panel loop and switch access on the source path and direct receiver access for high-power measurements.

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