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N19306B PAM-N Analysis
PLTS N19306B extends the N19301B base product to perform PAM-N (PAM3, PAM4, PAM6, PAM8) eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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Highlights
The industry standard for signal integrity measurements just got better.
- PAM-N modulation formats include PAM3, PAM4, PAM6 and PAM8 to accommodate new technologies using advanced modulation schemes for 1.6T.
- New eye diagram using Statistical Eye PRBS saves 10x design times for long pattern analysis.
- Improve your custom test efficiency with our new standard test wizard.
- Get accurate TDR waveforms with channel loss compensation.
- Mitigate crosstalk issues with multi-port channel analysis supported by a powerful 64-bit application.
The new Physical Layer Test System (PLTS) 2026 is the industry standard for signal integrity measurements and data post-processing tools for high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Signal integrity laboratories worldwide have benefited from the power of PLTS in the R&D prototype test phase and high-volume manufacturing (HVM) phases.
The PLTS 2026 in a powerful 64-bit application unleashing high port count s-parameter measurements. Today’s 1.6 Tbps internet infrastructure demands multi-port channel analysis to mitigate crosstalk issues that can cause bit errors. The new 64-bit PLTS application enables deeper memory for those large data files of 16-port and 32-port s-parameter measurements.
PLTS N19306B extends the N19301B base product to add PAM4 eye diagram analysis to the base product.
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N19306B PLTS PAM-N Eye Diagram
- PLTS N19306B extends the N19301B base product to perform PAM-N eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B
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