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Digital Design and Interconnect Standards


Overcome Challenges Across the Design Cycle

When digital signals reach gigabit speeds, “the unpredictable” becomes normal. In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. The process of getting your project back on track starts with the best tools for the job. 

Keysight’s solution set for high-speed digital test is a combination of hardware, software, and broad expertise built on ongoing involvement with industry experts.

Keysight’s tools for simulation, measurement, and compliance will help you cut through the challenges of gigabit digital designs. These tools provide views into the time and frequency domains, revealing underlying problems and ensuring your designs meet specifications. 

From initial concept to compliance testing, Keysight can help you uncover problems, optimize performance, and deliver your design on time. In the development of high-speed digital designs, Keysight is the only test and measurement company that offers hardware and software solutions across all stages of the entire design cycle: design and simulation, analysis, debug, and compliance testing. These same tools are essential to signal integrity (SI) analysis, whether you perform it independently or as a tightly interwoven part of the digital design process. 

Design and Simulation

Count on Keysight to help you through to a complete gigabit design. PathWave Advanced Design System (ADS) software and its capabilities model RF and microwave effects quickly and accurately. Use PathWave ADS and the Physical Layer Test System (PLTS) software to solve modeling problems such as long, lossy interconnects or crosstalk in densely packed interconnects. PLTS software calibrates and controls both vector network analyzer (VNA) and time domain reflectometry (TDR) measurements. 

PathWave ADS provides an integrated workflow that unites system, circuit, and physical-level design and simulation. This tight integration eliminates time-consuming and error-prone transfers between single-function tools. 

With PathWave ADS, you can work where you’re most comfortable: work in the time or frequency domain, or straddle both, to suit each task, component or problem. Straddling the domains is an effective way to debug stubborn problems. For example, mode-conversion analysis in the PLTS software helps pinpoint crosstalk problems in high-speed interconnects. Multi-domain analysis helps locate physical-layer problems in high-speed channels. 

To help pinpoint problems, PathWave ADS provides integrated simulation and data displays. PathWave ADS includes eye-diagram, mask, and bit error rate (BER) contour displays for visualizing channel- or circuitsimulation results. 

The PathWave ADS Channel Simulator (for serial buses) and DDR Bus Simulator (for parallel buses) produce ultralow BER contours in seconds by applying state-of-the-art statistical analysis techniques that include a unique treatment of transmitter jitter modeling that correlates closely with measured data. Both simulators support not only built-in generic models but also IC models conforming to the IBIS industry standard. 

SIPro Signal Integrity EM Analysis Element provides signal integrity (SI) analysis of high-speed PCBs. This enables you to characterize loss and coupling of signal nets and extract an elecromagnetic (EM)-accurate model, which can be used in the PathWave ADS Transient and Channel Simulators. 

PIPro Power Integrity EM Analysis Element provides power integrity analysis of your power distribution network (PDN), including DC IR drop analysis, AC impedance analysis, and power plane resonance analysis. The EM technologies in PIPro are tuned for PI applications; they are much faster and more efficient than general-purpose EM tools. PIPro utilizes a common setup and analysis environment within PathWave ADS. 

PathWave ADS supports your whole development flow, from early data-link engineering through the pre-layout and post-layout stages.

Analyze and Debug

With our high-speed digital solution set, you can estimate system performance with models of devices and structures before hardware design or fab shop results. Use proxy devices to estimate component behavior and vary device parameters to account for process variation, temperature drift, humidity effects, and more. To maximize design margins, you can assess a system’s segmented performance at IC pins, interface connectors, backplanes, and elsewhere. Collectively, these capabilities can help you predict and optimize yields. 

PathWave ADS lets you build a foundation for a deeper understanding through detailed models of the target system. You can then use measurement data to validate simulations with actual measurements made on the accessible ports of a physical prototype. With Keysight’s measurement tools, you have access to a wide range of physical parameters: oscilloscopes offering advanced measurement applications, logic analyzers, bit error ratio testers, vector network analyzers providing optional time domain reflectometry capability, and more. 

Real-world measurements reveal performance parameters that can help you identify critical components within a specific budget. They can also help you validate or refine assumptions in your simulations and enable correlation of model results with actual tests. To create consistent data sets, you can correlate data in the time, frequency, and simulation domains. For greater visibility, you can use simulation to interpolate and extrapolate waveforms in locations measurements can’t reach. 

For greater confidence in actual VNA and TDR measurements, the PLTS software includes advanced calibration wizards that help you avoid costly calibration errors. For greater test flexibility, you can mix and match coaxial and probe calibration kits with a single device under test (DUT). The probe calibration wizard will automatically download de-embed models for the probes used within probing stations. 

When viewing your measurements and test results, PLTS lets you easily switch between the time and frequency domains, choosing whichever is most informative for the problem under consideration. You can optimize your analysis by performing PLTS data correlation in either the time or frequency domain. You can now create de-embed models while removing fixture effects using a new technique called automatic fixture removal (AFR). 


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