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DDR Technology Testing Solutions
High-speed technologies such as double data rate (DDR) and low-power double data rate (LPDDR) carry significant design and test challenges. DDR is a memory chip technology that has progressed through multiple generations in the past 10 years. Each DDR generation improves in speed, efficiency, and memory capacity. But as the standard allows for more data transfer at faster rates, margins decrease. Therefore, design work and testing have become more challenging. Bit error rate testers (BERTs), oscilloscopes, probes, and associated compliance software alleviate some of the challenges when working on the physical layer. For a deeper analysis of the OSI layers, logic analyzers can help you test and debug your designs for functional and protocol compliance.Depending on where you fit in the design stage (device characterization, simulation, prototype, firmware, software), here are three types of tests essential to validate the current and next-generation DDR:• DDR5 receiver conformance and characterization • physical-layer and compliance testing• functional debug, analysis, and protocol compliance