Scattering Measurements Guide
Application Notes
This guide provides a comprehensive overview of scattering measurement techniques using Keysight instruments, including Mini-Diff and REFLET systems. It covers 2D and 3D bidirectional reflectance distribution function (BRDF) and bidirectional transmittance distribution function (BTDF) measurements, scanning planes, and angle of incidence recommendations to ensure accurate data collection. The guide explains spectral and filtered bidirectional scattering distribution function (BSDF) measurements, anisotropy vs. isotropy considerations, and best practices for sample preparation.
It also discusses advanced methods such as total integrated scatter (TIS) with specular rejection, volume scattering characterization and high-resolution BRDF near specular angles. This resource supports a wide range of applications in optics, automotive, aerospace and more.