Toggle Menu
Confirm Your Country or Area
Please Confirm
Confirm your country to access relevant pricing, special offers, events, and contact information.
What are you looking for?
Suggested searches
No product matches found - System Exception
Matched content
Increasing Test System Throughput
Power related test challenge:
In high-volume manufacturing applications increasing test system throughput is critical to reducing the total cost of test. As a test engineer working in high-volume manufacturing finding and implementing techniques and test hardware to achieve throughput gains is a never-ending quest.
How the APS helps you overcome the challenge:
- Fast up and down programming speeds (up to 500 µs)
- Fast command processing (< 2 ms)
- List capability to step through a list of voltage or current levels
- Seamless ranging capability for fast current measurements without sacrificing accuracy
View Video on YouTube – Increasing Test System Throughput
