Choose a country or area to see content specific to your location
Application Notes
The DDR libraries available are written with the assumption that all the pins are connected to a boundary scan cell. In a real board application however, there are pins that are not connected to boundary scan cells, in which case we will need to modify the DDR library to generate the silicon nail test.
Unlock Content
Sign up for free
*Indicates required field
Thank you.
Your form has been successfully submitted.
Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.