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NB-IoT System Modeling: Simple Doesn’t Mean Easy
This paper presents a method for modeling and evaluating a new Narrowband Internet of Things (NB-IoT) system in a combined multi-domain simulation environment.

應用手冊 2016-08-12

PDF PDF 1023 KB
Keysight EEsof EDA SystemVue
SystemVue is an EDA environment for electronic system-level (ESL) design that allows system architects and algorithm developers to innovate the physical layer (PHY) of communications systems.

技術總覽 2016-08-05

W1719 SystemVue RF System Design Kit
The W1719 brings fast nonlinear X-parameters (ADS) and Fast Circuit Envelope models (GoldenGate) into the dataflow environment, for system-level verification.

產品型錄 2016-08-04

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

新聞資料 2016-08-04

W1905 Radar Model Library
The W1905 Radar Model Library is a simulation reference library for designing and testing Radar and electronic warfare (EW) systems. It is available as an option to the SystemVue system-level modeling software.

產品型錄 2016-08-03

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2016-08-01

W1906EP/ET 5G Baseband Verification Library
Simulation Reference Library for Next- Generation Communication Architects, Standard Developers, Baseband Algorithm Researchers, and Component Verifiers in Research and Development.

產品型錄 2016-07-29

PDF PDF 1.54 MB
W1918 LTE-Advanced Baseband Verification Library
The W1918 LTE-Advanced Baseband Verification Library saves time, reduces engineering effort and accelerates the maturity of baseband PHY designs.

產品型錄 2016-07-28

PDF PDF 1.49 MB
Keysight Outlines its Commitment to the White House’s PAWR Initiative
Keysight outlines its commitment to the Platforms for Advanced Wireless Research (PAWR) Initiative (www.us-ignite.org/wireless), an industry consortium led by US Ignite and focused on creation of four, city-scale testing platforms.

新聞資料 2016-07-27

W1902 Digital Modem Library
The W1902EP/ET is a simulation reference library supporting 40 types of modulation for Satellite and Military Communications architects, baseband algorithm researchers, and component verifiers in R&D.

產品型錄 2016-07-26

W1717 SystemVue Hardware Design Kit - Data Sheet
The SystemVue W1717EP/ET generates fully synthesizable, hierarchical RTL-level Verilog and VHDL that is bit-true, and cycle accurate.

產品型錄 2016-07-26

Keysight Joins Next Generation Mobile Networks Alliance to Advance 5G Technology
Keysight announces that it has joined the Next Generation Mobile Networks (NGMN) Alliance (www.ngmn.org).

新聞資料 2016-07-25

ADS Video Tutorials
A collection of Keysight EESof EDA video playlists for Advanced Design System (ADS).

基本展示 2016-07-22

Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本展示 2016-07-20

E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

專題報導 2016-07-20

SystemVue Electronic System-Level (ESL) Design Software
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

型錄 2016-07-19

PDF PDF 1.72 MB
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

新聞資料 2016-07-19

Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本展示 2016-07-18

E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

產品型錄 2016-07-15

WaferPro Express Support Home
WaferPro Express support home page in Keysight EEsof EDA Knowledge Center.

使用手冊 2016-07-15

Follow Keysight EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

新聞簡訊 2016-07-14

ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Keysight Technologies highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

期刊 2016-07-14

Power Electronics Design & Simulation Videos on YouTube
Design & Simulation of Power Electronics with EDA Tools Videos on YouTube.

基本展示 2016-07-12

Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

應用手冊 2016-06-28

STMicroelectronics Unveils Free and Feature-Rich Simulator to Aid Design for EMC
ST has adopted Keysight EEsof EDA software, including ADS, for design and simulation as it is the gold standard for high-frequency and high-speed simulation. Now, ESD-SIM makes the ADS simulator available online, for evaluation of ST’s protection components.

新聞資料 2016-06-27

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