The W2637A, W2638A and W2639A LPDDR BGA probes provide signal accessibility and probing of embedded memory designs directly at the ball grid array (BGA) package. The Keysight Technologies, Inc. LPDDR BGA probes enable viewing of data traffic on industry standard LPDDR SDRAM, LPDDR NVM and mobile-DDR DRAM with the Keysight 16900 Series logic analysis system and Infiniium 9000 and 90000 Series oscilloscopes.
Features:
- Provides signal accessibility points for the LPDDR SDRAM, LPDDR NVM and mobile-DDR DRAM ball grid array (BGA) package.
- Supports:
- –– x16 package (60 balls) all signals
- –– x32 package (90 balls) all signals
- Note: Please refer to Table 1, 2, 3 and 4 for pin-out information
- Buried resistors provide signal isolation and minimize capacitive loading.
- Operating transfer rate of up to 400 Mb/s 1.5 GHz bandwidth
- Works with existing designs
- Supports either leaded or lead-free solder
- Contract manufactures available for those without the inhouse expertise or facilities for soldering BGAs
- Flexible “wings” with ZIF connectors
- Attach to E5384A, and E5826A, single-ended ZIF probes for connection to the logic analyzer
- Probe points available for oscilloscope E2678A socket probe head to the W2639A scope adapter board that connects to the flex-rigid of the LPDDR BGA probe
Benefits:
- Eliminates reflections from mid-bus probing methods. Also eliminates board space and trace routing required for connector probing methods.
- Get complete signal access to the LPDDR signals critical to your debug and validation effort.
- Acquire high-speed signals without impacting the performance of your design. The LPDDR BGA probe provides a non-instrusive electrical and mechanical between the memory device and an Keysight instrument.
- Operate at full speed whether you’re making measurements with a logic analyzer or oscilloscope
- Eliminates need for re-design or up front planning
- Easily works with all solder finishes. Designed to tolerate lead-free soldering temperature profiles.
- Eliminates the need to develop BGA soldering expertise.
- Ensures reliable connection to the ZIF probes. Enables placement of the probe cables around adjacent components.
- Minimizes the torque to the balls of the BGA
- Optimizes the use of logic analyzer channels by allowing assignments of channels to
- Enables oscilloscope probing of the DRAM signals with Keysight Infiniium 9000 and 90000 Series oscilloscope, giving you a LPDDR compliance test solution covering clock, electrical and timing parameters of the JEDEC specification
LPDDR BGA Connection to an Keysight Logic Analyzer
The W2637A LPDDR BGA probe connects to E5384A to provide connection to the logic analyzer for the x16 LPDDR package. The W2638A LPDDR BGA probe connects connection to the logic analyzer to E5384A and E5826A to provide for the x32 LPDDR package.
LPDDR BGA Connection to a Keysight Oscilloscope
The LPDDR BGA probe is used with W2639A scope adapter board and the E2678A scope socket probe head to connect to the oscilloscope. The scope socket probe head is attached to the pin headers on the scope adapter board. The scope socket probe head makes a 1.5 GHz bandwidth connection with the solder points on the BGA probe. The other alternative is using the W3635A scope probe adapter board and the N5425/26/51A ZIF tips. This method requires the ZIF tips to be soldered to the test points on the W3635A.
