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P9001A Massively Parallel Parametric Test System
Keysight P9001A Massively Parallel Parametric Test System for fastest parametric test to accelerate Time-to-Market and lower Cost-of-Test.
HIGHLIGHTS
- Notice for European Union Customers: A modified version of this non-RoHS compliant product has been made available to the European Union market, please contact your local Keysight Sales office for details. Keysight will maintain worldwide service and support of any P9001A test system throughout its support lifetime.
- The highest throughput parallel parametric test solution
- 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080
- Good data correlation with Keysight 4080
- True per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency)
- Easy development of parallel test plan
- Easy migration from 4080 environment
- Proven in 1st-tier logic foundries and memory companies
Key Specifications
Maximum Number of SPGU output channels
n/a
Maximum Number of Measurement Pins
100
Minimum Current Measurement Resolution
0.1 fA
Minimum Voltage Measurement Resolution
2 µV
Parallel Parametric Test Capability
Yes
Maximum Number of SPGU output channels
Maximum Number of Measurement Pins
Minimum Current Measurement Resolution
Minimum Voltage Measurement Resolution
Parallel Parametric Test Capability
n/a
100
0.1 fA
2 µV
Yes
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Additional Features:
Parallel Parametric Test
CV measurement
Form Factor:
n/a
Maximum Number of Measurement Pins:
100
Maximum Number of SPGU output channels:
n/a
Minimum Current Measurement Resolution:
0.1 fA
Minimum Voltage Measurement Resolution:
2 µV
Parallel Parametric Test Capability:
Yes
Type:
Parametric Test Solution
Interested in a P9001A?
Extend the capabilities for your Massively Parallel Parametric Test System
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