Digital Protocol Analyzers Catalog

Explore the comprehensive range of Keysight digital protocol analyzers engineered to capture, decode, and validate high‑speed digital interfaces. This catalog highlights portable logic analyzers, DDR memory analyzers, and PCIe/CXL protocol solutions across multiple performance classes for embedded design, memory validation, and serial protocol compliance testing.

Keysight DDR Logic Analyzers

Keysight DDR Logic Analyzers provide modular high-speed memory protocol testing and debugging capabilities for DDR and LPDDR system validation.

How to Analyze Signal Integrity in DDR Memory

New InfiniiScan software helps save time by eliminating the need to isolate read-write signals to analyze signal characteristics in DDR memory. Learn how!

DDR Memory Design and Test Overview

Brief overview of Keysight solutions for DDR design and test.

DDR Technology Testing Solutions

High-speed technologies such as double data rate (DDR) and low-power double data rate (LPDDR) carry significant design and test challenges. DDR is a memory chip technology that has progressed through multiple generations in the past 10 years. Each DDR generation improves in speed, efficiency, and memory capacity. But as the standard allows for more data transfer at faster rates, margins decrease. Therefore, design work and testing have become more challenging. Bit error rate testers (BERTs), oscilloscopes, probes, and associated compliance software alleviate some of the challenges when working on the physical layer. For a deeper analysis of the OSI layers, logic analyzers can help you test and debug your designs for functional and protocol compliance.Depending on where you fit in the design stage (device characterization, simulation, prototype, firmware, software), here are three types of tests essential to validate the current and next-generation DDR:• DDR5 receiver conformance and characterization • physical-layer and compliance testing• functional debug, analysis, and protocol compliance

Separating Read & Write Signals for DDR DRAM & Memory Controller

See how InfiniiScan oscilloscopes help you to easily separate read and write signals in DDR RAM and the memory controller to solve test problems.

DDR Memory Overview, Development Cycle and Challenges

This paper gives an overview of DDR memory, DDR interfaces, and outlines techniques to overcome common DDR validation challenges to improve signal performance.

Separating Read and Write Signals for DDR DRAM

Keysight InfiniiScan provides a new innovative method for separation which allow you to quickly and reliably separate read and write signals for DDR DRAM. Learn more.

W3630A Series DDR3 BGA Probes for Logic Analyzers and Oscilloscopes

The W3630A Series DDR3 BGA probes enable probing of embedded memory DIMMs directly at the ball grid array with Keysight's logic analyzers and oscilloscopes.

DDR Memory Design and Test – A Better Way

Keysight offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

DDR Probing for Physical Layer and Functional Testing

Probing is the key to accessing signals and validating your designs. Although, you may normally probe at signal vias or designed-in probe points, for DDR these do not always provide good signal integrity.

DDR and DDR2 – Debugging Intermittent Memory Failures

Learn how to validate and debug high-speed memory systems and find root cause of intermittent memory failures in DDR and DDR2 systems.

W2309EP/ET DDR Bus Simulator and W2317EP/ET DDR Bus Simulator Distributed Computing 8-pack

The W2309EP DDR Bus Simulator quickly generates accurate BER contours, masks, and margins between the two, for the DDR memory bus specification published by JEDEC.

Keysight DDR Memory Analysis Software Guided Demo

Explore the Keysight DDR Setup Assistant. Learn to tune your logic analyzer for DDR/LPDDR memory traffic with a guided step-by-step demo, ensuring accurate measurements and efficient setup.

Capture Highest DDR3 Data Rates Using Advanced Probe Settings onLogic Analyzers - Technical Brief

Advanced Probe Settings (APS) mode on Keysight logic analyzers enables significantly higher DDR3/4 and LPDDR3/4 data rate captures from BGA probing.

Debugging Signal Integrity and Protocol Layers on DDR Designs

As DDR data transmission rates increase, signal integrity and clarity become critical concerns. Learn to resolve debugging failures – one of the primary challenges with DDR.

Modifying DDR Libraries for Silicon Nail Test Generation

Find how to modify DDR libraries for silicon nail test generation on the Keysight x1149 boundary scan analyzer. Explore the nail test generation procedures!

Low-Cost DDR3 Decode and Analysis with Portable Logic Analyzers

Make low cost measurements on DDR3 interfaces and conduct memory bus decode, compliance testing and performance analysis with portable logic analyzers.

W2630 Series DDR2 BGA Probes for Logic Analyzers and Oscilloscopes

Keysight W2630A series DDR2 BGA probes for logic analyzers and oscilloscopes enable viewing of data traffic on industry standard DDR2 DRAMs with the Keysight 16900 Series logic analysis system and Infiniium 80000 Series oscilloscopes.

DDR Memory Test Challenges from DDR3 to DDR5

From DDR3, DDR4 and DDR5, learn the progression of the technology, how tests have evolved, and the test equipment that can help combat challenges.