Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters

This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family;the 4284A and the 4285A 30 MHz LCR meter with digital Q capability.

Understanding DC-Coupled and DC-Blocked Power Sensors

Discover the difference of DC-coupled and DC‑blocked power sensors and how a DC-coupled power sensor impacts measurement accuracy.

Tips for Preventing Damage to Network Analyzers

Read these maintenance tips for preventing damage to your network analyzer and ensure better network analyzer measurements.

Computing ACPR, EVM, PAE, and mean transmitted RF carrier power, from a Ptolemy Co-Simulation, including power sweeps and statistical variation

Read tips to design a power amplifier that will meet ACPR and EVM specifications using ADS Ptolemy co-simulation including power sweeps and statistical variation.

Lead Acid Battery Charger Test with USB DAQ Devices

This paper explains the lead acid battery charging and discharging test set up, and how Keysight USB DAQ device offers simple way to the testing needs.

PCIe Boundary-Scan Testing for Server Motherboards

Validate PCIe lanes, power rails, and interconnects on server motherboards without using actual components. Learn how Keysight’s x1149 and Smart PCIe Plug-in cards deliver safer, faster, and more cost-effective boundary-scan testing for high-density server designs.

Time-Gated Spectral Analysis with X-Series Signal Analyzers

Time gating allows you to measure the spectrum of a periodic signal during a specific portion of time, typically the on-time of the bursted signal. A trigger is used to synchronize when the burst occurs. In many cases the spectral components that otherwise would contribute to the pulse’s rising and falling edge will mask spectral components that contribute to the spectrum of the pulse during its on time. Gating is also useful for applied spectral measurements such as channel power, adjacent channel power, and spectral emission mask measurements of a modulated signal that is bursted in the time domain. This application note will discuss four basic items needed to make successful time-gating measurements.

Methods and Instruments for Phase Noise Measurement

In this article, we delve into various methods for measuring phase noise and explore the instruments commonly used for this purpose. Will discuss the theoretical foundations, practical considerations, and advantages and disadvantages of each method. Additionally, we’ll introduce typical instruments employed in phase noise testing.

Noise Figure Measurement Accuracy: The Y-Factor Method

This app note discusses the fundamentals of noise figure measurement using Y-factor method and how to avoid noise figure mistakes.

Network Parameter Measurement: Best Practices using the Medalist i3070 In-Circuit Test

The capability of Network Parameter Measurement (NPM) in Medalist i3070 in-circuit tester allows users to detect opens on power and ground pins. Learn more.

How to Choose the Right Power Meter and Power Sensor

This app note guides you to choose the right power meter and power sensors, as well as explains the advantage and disadvantage of each sensor technology.

10 Tips for Making Your Best Power Integrity Measurements

Fundamental techniques for measuring and analyzing DC power supplies using MXR-Series oscilloscopes, D9110POWA power integrity analysis software, and N7020A power rail probes.

Optimize Power Source Integrity Under Large Load Transients

Today’s integrated circuits are operating faster than ever. The increased operating speed can lead to highly dynamic power demand from the power supply, which poses a challenge during testing when you source power using programmable power supplies. The high-speed current waveforms can lead to voltage drops at the integrated circuit. If it is severe enough, the voltage drop can reset the microprocessor or cause anomalies in your test results. This application note explains why this voltage drop occurs and offers several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Troubleshooting Load Cell Applications with the Keysight Wireless Remote Connectivity Solution

How do you know if a load cell is bad? Learn how to do load cell troubleshooting and identify problem using Keysight’s wireless remote connectivity solution.

"Shotgunning" a Bad Fit for Lead-Free Test

Shotgunning is a common repair technique in functional test. This Shotgunning method is negatively affected by lead-free processes. Learn More!

Making Accurate Radar Pulse Measurements

Read these best practices for making fast and accurate radar pulse measurements, and how to maximize pulse measurement speed using power meters and power sensors.

Evaluating Oscilloscope Bandwidths for Your Application

How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Oscilloscope Fundamentals

Acquire skills in the art of oscilloscope basics and their practical applications. Learn the essentials of using oscilloscopes for precise signal analysis and testing.

The Parametric Measurement Handbook - Edition 5

The 5th edition of Keysight’s Parametric Measurement Handbook is a complete parametric measurement reference, with information helpful for both novice and advanced users.

Sheet Resistivity and Sheet Resistance Measurement Using an SMU

Learn resistance measurement basics and see how Keysight’s current-voltage analyzer allows you to perform easy, accurate sheet resistance measurements.