Column Control DTX

Elastic Modulus Mapping Using the 7500 AFM

Application Notes

The atomic force microscope (AFM) 1 has become a very important tool for investigating samples on the nano-scale. It combines in a unique way high spatial resolution with very high force sensitivity, allowing for mapping of elastic properties with highest spatial resolution.

For quantitative determination of elasticity a force distance curve is obtained. From such a force distance curve the elastic modulus can be extracted. A mapping of local elastic properties is achieved by obtaining two-dimensional arrays of force distance curves. Such elasticity maps can be used to derive information on cellular processes. In particular, elasticity measurements provide valuable insights into various dynamic cellular processes such as cell migration and cell division.

Here, we show how the Keysight Technologies, Inc. 7500 AFM can be utilized to map the elastic modulus of endothelial cells.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX