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Designing and Testing Stepped Frequency Radar Systems

Application Notes

Stepped Frequency Radar (SFR) is well known for non-destructive testing and ground searching applications. With SFR, the echoes of stepped frequency pulses are synthesized in the frequency domain to obtain shorter pulses in the time domain. Using frequency hopping, both high resolution and a high signal-to-clutter ratio can be achieved. As a high range resolution radar technique, SFR offers a number of key advantages over other techniques like regular pulse radar. Such advantages include target classification, resolution of multiple targets, accurate range profile, detection of low radar cross section (RCS) targets in clutter, and low cost. Because of these advantages, SFR is today widely used in both the commercial and aerospace/defense (A/D) industries.

 

This application note introduces a simulation platform—Keysight Technologies, Inc. SystemVue electronic system level (ESL) design software—which easily links to measurement tools to enable the design, validation and test of SFR systems under different environments. The simulation platform with test environment includes return signal RCS and background clutter. A template SFR design is also provided. SFR design is performed in SystemVue. Then, simulation results are evaluated with Tx and Rx measurements. Users can customize the template SFR design to their own systems and run simulations in the platform to evaluate the design’s performance. The simulation platform also can be used as a test platform for SFR component test. As an example, an SFR system with target returns and ground clutter will be presented that uses the platform for both simulation and test. The proposed platform works very well for design, as well as for verification and testing of SFR systems.

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