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Provide the capability to test the functionality of embedded instruments within a semiconductor device without defining the instruments or their features.

The M6803B tool provides a powerful capability to test the functionality of embedded instruments within a semiconductor device without the need to define the instruments or their features. By adding the necessary ICL and PDL files as libraries and assigning them to the relevant devices, the tool can automatically generate tests for devices compliant with the IEEE 1687 standard.

 

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