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產品特性

  • 短線測試夾具技術確保可攜性、可重複性和穩定性
  • 創新設計確保簡易的維護和測試夾具更換
  • 輕巧型機箱，長度僅 800 mm 或 31.5 吋
  • 自動化 ICT 解決方案可實現單點連接
  • 全套系統套件包含各種邊界掃描工具

i3070 系列 5i Inline ICT 保留了 Keysight 3070 和 i3070 系統倍受歡迎的獨家短線測試夾具技術。

短線測試夾具技術克服了長線夾具的常見問題，例如雜訊和測試穩定性降低。 也就是說，即便是您需要橫跨半個地球或在不同的製造基地部署測試，i3070 系列 5i 均提供可轉移、可重複和穩定的測試。

I3070 系列 5i Inline ICT 為忙碌的生產線操作人員和測試工程師提供簡易測試操作。 插卡箱安裝在重型滑軌上，可輕鬆拉出以更換模組卡。

符合人體工學設計的組合抽屜，方便您輕鬆裝入或卸下測試系統中的測試夾具。 這些特性可節省時間和體力，尤其是生產線正在測試多元產品時。

智慧夾具識別、電路板定向探測和測試計畫版本控制等工具，可協助您開發業界一流的自動化解決方案，以便測試當今複雜的印刷電路板組件。

i3070 系列 5i 與您的 3070 和 i3070 測試程式完全相容。

如需更多關於 ICT 系統的資訊，請瀏覽 ICT System - i3070。

主要技術規格

下載產品規格書
Fixture Actuation
Press Down
最大節點計數
2592
Max Parallel Testing
2
System Type
Automated Handler
System Width
800 mm
Fixture Actuation
最大節點計數
Max Parallel Testing
System Type
System Width
Press Down
2592
2
Automated Handler
800 mm
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Fixture Actuation:
Press Down
最大節點計數:
2592
Max Parallel Testing:
2
System Type:
Automated Handler
System Width:
800 mm
E9988EL 雙模組 ICT 系統

您對 E9988EL 感興趣嗎？

擴充包含雙模組的 In-Circuit 測試（ICT）系統的功能，I337x 系列 5I

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In-Circuit 測試系統精選資源

Application Notes 2024.05.09

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

2024.05.09

Application Notes 2024.05.07

Integrating LED Analyzer with Keysight's In-Circuit Tester

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

2024.05.07

Application Notes 2024.01.30

Streamlining In-System Programming

Streamlining In-System Programming

This application note explores the challenges and solutions in implementing In-System Programming (ISP) on densely populated circuit boards. Focusing on Keysight's advanced ICT system, the document discusses upgraded hardware configurations and introduces the ISP OpenTAP plug-in for streamlined test sequence generation. With a simplified approach to test generation and execution, Keysight's solution offers an efficient pathway for ISP integration. This resource serves as a practical guide for test engineers seeking to optimize ISP processes, enhance efficiency, and reduce complexities in programming.

2024.01.30

Application Notes 2024.01.30

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.01.30

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

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查看 i3070 ICT 測試夾具配件，從測試夾具套件到無向量測試零件，接著選擇產品或零件，以便索取報價。

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配備微型放大器的是德科技無向量測試解決方案，可顯著擴大測試覆蓋範圍。 體積更小，占用空間縮減了 60%。

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