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產品特性

  • 最大節點數：2,592
  • 最大通道數：576
  • 體積：0.95m x 0.94m
  • 最大模組數：2

您的生產線需要高量測速率。 量測速率需要測試效率、測試系統穩定性，以及無縫的設備整合。 Keysight i3070 系列 6 可滿足以上需求。 系列 6 ICT 系統以經過實證的技術為基礎，可提供比過去產品更高的測試效率。 系列 6 的軟體、硬體及可程控性均經過長時間證明，與舊有系統完全相容，並提供可重複的量測結果。

  • 善用邊界掃瞄、Silicon Nail 測試及動態 flash 程控，將測試速度提高 4 倍，進而全面提升測試效率。
  • 100% 的向後相容性，可全面減少安裝時的停機時間，而且原始碼完全相容。
  • IPC-CFX 與 Hermes 等通過認證的 M2M 功能可提升運作效率、增加對測試資料的了解、縮短響應時間，進而降低營運成本。
  • Keysight On-site Now! 可提供領先業界的支援服務。 在最短時間內，快速、安全、免手持地取得專家支援。
  • 現代化軟體授權方式，讓授權成本變得更公開透明；此外，企業可集中管理授權，並依據生產需求來擴充授權規模。

主要技術規格

下載產品規格書
Fixture Actuation
Vacuum
最大節點計數
2592
Max Parallel Testing
2
System Type
Offline System
System Width
954 mm
Fixture Actuation
最大節點計數
Max Parallel Testing
System Type
System Width
Vacuum
2592
2
Offline System
954 mm
查看更多
Fixture Actuation:
Vacuum
最大節點計數:
2592
Max Parallel Testing:
2
System Type:
Offline System
System Width:
954 mm
E9905G 雙模組在線測試（ICT）系統 Keysight

您對 E9905G 感興趣嗎？

擴充具備雙模組的 In-Circuit 測試（ICT）系統功能，i327x 系列 6

軟體
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配件
查看所有配件
保固、校驗及服務
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支援
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E9905G 雙模組的 In-Circuit 測試（ICT）系統的精選資源，i327x 系列 6

Application Notes 2024.05.15

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

2024.05.15

Application Notes 2024.05.07

Integrating LED Analyzer with Keysight's In-Circuit Tester

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

2024.05.07

Application Notes 2024.01.30

Streamlining In-System Programming

Streamlining In-System Programming

This application note explores the challenges and solutions in implementing In-System Programming (ISP) on densely populated circuit boards. Focusing on Keysight's advanced ICT system, the document discusses upgraded hardware configurations and introduces the ISP OpenTAP plug-in for streamlined test sequence generation. With a simplified approach to test generation and execution, Keysight's solution offers an efficient pathway for ISP integration. This resource serves as a practical guide for test engineers seeking to optimize ISP processes, enhance efficiency, and reduce complexities in programming.

2024.01.30

Application Notes 2024.01.30

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.01.30

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

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3070AF ICT i3070 配件

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查看 i3070 ICT 測試夾具配件，從測試夾具套件到無向量測試零件，接著選擇產品或零件，以便索取報價。

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配備微型放大器的是德科技無向量測試解決方案，可顯著擴大測試覆蓋範圍。 體積更小，占用空間縮減了 60%。

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