Multiport and Multi-site Test Optimization Techniques Webcast

WHAT IS THE WEBCAST ABOUT

With the trend towards adding more ports on components such as filters, cables, front end modules and antennas, accurate and fast multiport network analysis is required. Optimizing your vector network analyzer (VNA) configuration is critical to minimizing manufacturing cost-of-test. Keysight's new PXI-based VNA drastically improves the test speed for multiport devices by eliminating the switching time required for conventional multiport test sets. The single slot modular PXI form factor enables new possibilities for multi-site measurements (multiple-device parallel measurements) by allowing multiple VNAs to fill the same space as a single benchtop VNA. This webcast provides an overview of multiport and multi-site capabilities, how different multiport test solutions compare, calibration methods, and what considerations need to be made when configuring a multi-site test station.

WHO SHOULD ATTEND

RF/uW component manufacturers and users in R&D and production.

PRESENTER

Dr. Joel Dunsmore, Keysight Fellow in Component Test Division R&D

Since graduating from Oregon State University with an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies at the Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is one of only five Keysight Fellows (the highest technical level at Keysight), and a senior R&D engineer in the Component Test Division. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in the area of non-linear test including differential devices, and mixer measurements. He has received 25 patents related to this work, and authored the “Handbook of Microwave Component Measurements”. He co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT and Keysight.