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NX5402A Silicon Photonics Wafer Test System
One-stop, fully automated and volume production-ready Silicon Photonics wafer test solution with guaranteed system performance
スタート価格:
Highlights
- One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
- Automated one pass testing for complex and massive optical and electrical measurements
- Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
- High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
- Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
- Dedicated support model enabling high system availability for production
- Keysight-developed Fiber Alignment and Positioning System
- Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
- Reliable performance monitoring by Build-in Automatic System Diagnostics
- Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode
主な仕様
最大SPGU出力チャネル数
n/a
最大測定ピン数
12 (optical in), 12 (optical out), 30 (electrical)
最小電流測定分解能
n/a
最小電流測定分解能
n/a
Parallel Parametric Test Capability
いいえ
最大SPGU出力チャネル数
最大測定ピン数
最小電流測定分解能
最小電流測定分解能
Parallel Parametric Test Capability
n/a
12 (optical in), 12 (optical out), 30 (electrical)
n/a
n/a
いいえ
さらに表示
追加機能:
n/a
形状:
n/a
最大測定ピン数:
12 (optical in), 12 (optical out), 30 (electrical)
最大SPGU出力チャネル数:
n/a
最小電流測定分解能:
n/a
最小電流測定分解能:
n/a
Parallel Parametric Test Capability:
いいえ
タイプ:
Silicon Photonics Wafer Test Solution
Extend the capabilities for your Silicon Photonics Wafer Test System
Featured Resources for the Silicon Photonics Wafer Test System
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