Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

Optimizing In-Circuit Testing with x1149 Boundary Scan Integration

Application Notes

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

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