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產品特性

  • 短線測試夾具技術確保可攜性、可重測性和穩定性
  • 可處理最大 28 吋 x 24 吋的大尺寸電路板
  • 創新設計確保簡易的維護和測試夾具更換
  • 自動化 ICT 解決方案可實現單點連接
  • 全套系統套件包含各種邊界掃描工具
  • 屢獲大獎的全套是德科技 ICT 解決方案

i3070 系列 5i Inline ICT 保留了 Keysight 3070 和 i3070 系統倍受歡迎的獨家短線測試夾具技術。

短線測試夾具技術克服了長線夾具的常見問題，例如雜訊和測試穩定性降低。 也就是說，即便是您需要橫跨半個地球或在不同的製造基地部署測試，i3070 系列 5i 均可提供可轉移、可重複和穩定的測試。

I3070 系列 5i Inline ICT 為忙碌的生產線操作人員和測試工程師提供簡易的測試操作。 所有儀器都可從前方進行操作，以便於維護。

智慧夾具識別、電路板定向探測，以及測試計畫版本控制等工具，可協助您開發業界一流的自動化解決方案，以便測試當今複雜的印刷電路板組件。

i3070 系列 5i 完全向後相容於 3070 和 i3070 測試程式。

如需更多關於 ICT 系統的資訊，請瀏覽 ICT 系統 - i3070。

主要技術規格

下載產品規格書
Fixture Actuation
Press Down
最大節點計數
5184
Max Parallel Testing
4
System Type
Automated Handler
System Width
1800 mm
Fixture Actuation
最大節點計數
Max Parallel Testing
System Type
System Width
Press Down
5184
4
Automated Handler
1800 mm
查看更多
Fixture Actuation:
Press Down
最大節點計數:
5184
Max Parallel Testing:
4
System Type:
Automated Handler
System Width:
1800 mm

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擴充您的 4 模組在線測試（ICT）系統功能，I367x 系列 5i

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E9986E 4 模組在線測試（ICT）系統的精選資源，i367x 系列 5i

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

Case Studies 2019.05.21

Automotive Electronics Manufacturer Quadruples Throughput

Automotive Electronics Manufacturer Quadruples Throughput

Using the Keysight i3070 4-Module In-Circuit Test System, one automotive electronics manufacturer increased test throughput more than 50%. Learn more!

2019.05.21

Application Notes 2019.02.10

Testing An Electrolytic Capacitor Using i3070 ICT System

Testing An Electrolytic Capacitor Using i3070 ICT System

A description of the alternate polarity test solution for electrolytic capacitor that mounted on printer circuit board assembly using the i3070 ICT system.

2019.02.10

Application Notes 2017.11.30

Integrity Test Using x1149 Boundary Scan Analyzer

Integrity Test Using x1149 Boundary Scan Analyzer

This application note describes in detail what tests the Keysight x1149 Boundary Scan Analyzer performs during Integrity test.

2017.11.30

White Papers 2015.06.07

A Bead Probe CAD Strategy for In-Circuit Test

A Bead Probe CAD Strategy for In-Circuit Test

Explore a bead probe CAD strategy for in-circuit test. Learn how to use bead probes in computer aided design (CAD) systems for production.

2015.06.07

Flyers 2014.07.30

Medalist i3070 In-Circuit Test System Onsite Calibration Service

Medalist i3070 In-Circuit Test System Onsite Calibration Service

This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.

2014.07.30

Flyers 2017.06.04

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements

This one-pager contains an overview of Keysight i3070 Upgrade Support Agreements to better preserve your investment and enhance test capabilities on your i3070.

2017.06.04

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