The Integrated Circuit Characterization & Analysis Program (IC-CAP) is the industry standard platform for DC and High Frequency measurement and modeling of semiconductor devices.

Introducing IC-CAP 2010.08

IC-CAP 2010.08 continues to provide innovative modeling solutions and introduces the breakthrough integrated solution IC-CAP WaferPro for automated measurements. In addition, 3 and 4 port measurement and simulation is possible, extending characterization and modeling capabilities, and 2-tone harmonic balance simulations are available for advanced model verification. New model versions for the CMOS extraction packages include HiSIM 2.5.1 and HiSIM HV 1.2. The user interface has been updated with new icons and features to facilitate intuitive ease of use. The ability to copy and paste multiple transforms in a single step enhances efficiency in customizing model extraction.

W8510 IC-CAP Wafer Professional

IC-CAP WaferPro is a turnkey automated measurement application for device modeling engineers who do DC/CV and RF measurements, which is fully integrated into the IC-CAP platform. IC-CAP WaferPro was designed in partnership with major semiconductor companies. It takes advantage of IC-CAP’s powerful measurement and programming environment to enable a library of efficient measurement routines (built-in and user defined), such as adaptive measurement algorithms, which can greatly reduce the overall measurement time and add efficiency. It is simple enough that one can have it running in one day, yet customizable and flexible enough, that it can be adapted and optimized for a wide variety of test and measurement environments.

The 85194M HiSIM CMOS Extraction Package now supports version 2.5.1 with VerilogA and the 85194Q HiSIM HV CMOS Extraction Package now supports version 1.2.

The most evolved industry-standard CMOS model implementations are now available for achieving the best and most accurate simulation of MOS device model behaviors. Use of VerilogA gives the option to access the most current model implementations and do model customization.

Multiport 3 and 4-Port Measurement and Simulation

New and extended device characterization is now possible via support of multiport measurements and simulation. One can now make differential measurements, and characterize mixers and other 3 and 4 port devices.

2 Tone Harmonic Balance Simulation

Many design applications now often require the accurate modeling and verification of higher order device behaviors. This is now possible via support for 1 and 2 Tone Harmonic Balance simulations in IC-CAP.

Copy/Paste of Multiple Transforms

When doing customization of model extractions in IC-CAP, it is often useful to leverage existing model extraction methods and algorithms implemented in PEL. In IC-CAP 2010.08, this can be accomplished very efficiently through the ability to copy, cut and paste multiple transforms in a single step.

Updated UI Features and Icons

New graphical user interface features and easy-to-read icons enhance the IC-CAP experience and ease of use.

Learn More

You can find more detailed descriptions and examples on the new features of this release in the "What's new in IC-CAP 2010.08?" presentation.

Looking for another version? View other IC-CAP Product Versions.