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N9441A Environmental Control

產品狀態: 已停產 | 目前可支援
此產品已停產

此產品沒有替代產品。

主要技術規格

Notice to EU customers: This product is no longer available due to lack of compliance with EU RoHS directive 2011/65/EU. Keysight will continue service and support to the end of worldwide support life.

  • Convenient access to all microscope controls affords excellent ease of use
  • Sample protected from the external environment to prevent damage & contamination
  • No condensation while cooling preserves sample integrity during temperature-dependent studies
  • Sealed environment permits experiments involving reactive or harsh gases
  • Eight inlet/outlet ports provide excellent flow-through control

敘述

Keysight's environmental isolation chamber (EIC) is specifically designed to meet the many requirements of intricate, demanding atomic force microscopy and scanning probe microscopy research. The EIC mounts directly to Keysight AFM/SPM microscopes and provides a sealed sample compartment that is completely isolated from the rest of the system. Eight inlet/outlet ports permit the flow of many different gases into or out of the sample area. Keysight´s scanners reside outside the EIC, so they are protected from contamination, harsh gases, solvents, caustic liquids, and other damaging experimental conditions. With the EIC, humidity levels can be controlled, oxygen levels monitored and controlled, and reactive gases easily introduced into and purged from the sample chamber.